Multi-Sample Nanoparticle Size Measurement System nanoSAQLA

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Multi-Sample Nanoparticle Size Measurement System nanoSAQLA

Model nanoSAQLA

Manufacturer: Otsuka Electronics, Japan

Multi-Sample Nanoparticle Size Measurement System nanoSAQLA

This is a particle size measurement system (particle size 0.6 nm - 10 μm*) that uses the `dynamic light scattering method` (DLS method).
Various functions are included to further improve quality control.
It measures in high speed (approx. 1 minute) and it is also lightweight and compact which is essential for use in laboratories, and this new optical system is able to measure multiple samples at one time with a wide concentration range from dilute to concentrated.

In addition, it is a new product not immersed in the liquid (non-immersion type), so contamination is not an issue and up to 5 samples can be measured without stopping, when used without the autosampler.

*Minimum value with histogram analysis : 0.2 nm

nanosaqla

Features

■Features of nanoSAQLA

Simple and quick one-time setup of up to 5 samples each under different conditions.
Measures both dilute and highly concentrated samples
Measures in approximately 1 min +
Includes temperature gradient function
Contamination-free continuous measurement

Measurement range(theoretical value)

Particle Size range 0.6 nm-10 μm*
Applicable concentration range 0.00001-40 ％
Temperature range 0-90℃

*Minimum value with histogram analysis : 0.2 nm

pecification

Model	Multi-Sample Nanoparticle Size Measurement System
Principle	Dynamic light scattering method
Light source	High power semiconductor laser ^*1
Detector	Highly sensitive APD
Successive measurement	Up to 5 samples
Measurement range	0.6 nm - 10 μm*2
Corresponding concentration	0.00001 - 40 % ^*3
Temperature	0 - 90℃ （with gradient function） ^*4
Size	240(W) X 480(D) X 375(H) mm
Weight	About 18 kg
Software	Analysis of average particle size (Cumulant approach)
	Analysis of particle size distribution （Marquardt algorithm/NNLS/Contin algorithm/Unimodal algorithm）
	Overlap of particle size distribution
	Inverse correlation function/residual plot
	Particle size plot
	Range of displayed particle size （0.1 - 10⁶ nm）
	Function to calculate molecular weight
Option	Micro volume cell (samples 20 μL and up), band-pass filter

*1 This product is classified as class 1 according to IEC 60825-1/JIS C 6802
　 laser safety standards
*2 Minimum value with histogram analysis : 0.2 nm
*3 PS Latex Particle:0.00001 - 10 % Taurocholic acid：-40 %
*4 0 - 90℃ with glass cell with batch cell holder,15-40℃ with 5 attached cell holder
or disposable cells