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Hotline: +8424 62967539  |  ADD: RM 630, 6th Floor, CIC Tower, No. 2 Nguyen Thi Due Str., Cau Giay, Ha Noi, Vietnam.

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Phenom Pure G6

Phenom Pure G6
phenom-pure-g6 - ảnh nhỏ  1

Phenom Pure G6

The Thermo Scientific Phenom Pure Desktop Scanning Electron Microscope (SEM) is an ideal tool for the transition from light optical to electron microscopy. It is an economical solution for high-resolution imaging, providing the best imaging results in its class.

The Phenom Pure Desktop SEM provides high-quality images thanks to the long-lasting, high-brightness CeB6 source, and offers the market’s fastest loading and imaging time. The very reliable autofocus and automated source alignments make this the most user-friendly system on the market. 

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Key Features

Never lost navigation

The user always knows the position on the sample with the unique never lost navigation. Overviews of both the optical and electron optical images provide clear reference points at all times. Thanks to the integrated motorized stage, you can navigate quickly through your sample.

Easy to use

Users are ready to take images after only 10 minutes of basic training. A large variety of sample holders is available to accommodate a large range of samples. Sample loading is fast and safe due to our patented sample vacuum loading technology.

Customize your SEM

The Phenom Pure Desktop SEM can be equipped with two optional detector systems.  The first one is a fully integrated energy dispersive spectroscopy (EDS) system. The second is a secondary electron detector (SED) for applications that require surface and topography sensitive imaging. 


Specifications

Light optical magnification
  • Fixed 27x
Electron optical magnification range
  • 160–175,000x
Resolution
  • ≤15 nm
Digital zoom
  • Max. 12x
Light optical navigation camera
  • Color
Acceleration voltages
  • Default: 5 kV and 10 kV
Vacuum modes
  • High-vacuum mode
  • Charge-reduction mode via optional low vacuum sample holder
Detector
  • Backscattered electron detector (standard)
  • Energy-dispersive X-ray spectroscopy detector (optional)
  • Secondary electron detector (optional)
Sample size
  • Up to 25 mm diameter
  • 32 mm (optional)
Sample height
  • Up to 35 mm
  • 100 mm (optional)
Desktop SEM blog

Desktop SEM Blogs

Want to unlock the great power of scanning electron microscopy without having to compromise on usability? Enhance your knowledge on Scanning Electron Microscopy and find out how Desktop SEM can optimally support your research in our Phenom Desktop SEM blogs.

Learn more

SEM image of gear wheel
SEM image of gear wheel
SEM image of feather bird
SEM image of feather bird
SEM image of diatom
SEM image of diatom
SEM image of smartphone
SEM image of smartphone
SEM image of pink clover stamens
SEM image of pink clover stamens
SEM image of cable
SEM image of cable
SEM image of textile
SEM image of textile
SEM image of metal particle
SEM image of metal particle
SEM image of double Perovskite LaSrZnFeO<sub>6</sub>
SEM image of double Perovskite LaSrZnFeO6

Applications

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Process Control
 

Modern industry demands high throughput with superior quality, a balance that is maintained through robust process control. SEM and TEM tools with dedicated automation software provide rapid, multi-scale information for process monitoring and improvement.

 

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Quality Control
 

Quality control and assurance are essential in modern industry. We offer a range of EM and spectroscopy tools for multi-scale and multi-modal analysis of defects, allowing you to make reliable and informed decisions for process control and improvement.

 

Fundamental Materials Research_R&amp;D_Thumb_274x180_144DPI

Fundamental Materials Research

Novel materials are investigated at increasingly smaller scales for maximum control of their physical and chemical properties. Electron microscopy provides researchers with key insight into a wide variety of material characteristics at the micro- to nano-scale.

 

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GSEM., JSC

Tel: +8424 62967539; Email: sales@gsemvn.com

Head Office: RM 630, 6th Floor, CIC Tower, 1 Nguyen Thi Due Str., Cau Giay Dist., Hanoi, Vietnam.

Registered Address: No. 18 Alley 313/6 Lane 313 Linh Nam, Hoang Mai, Hanoi